Measurement software updated

Verisurf Software Inc. (Anaheim, CA, US) has introduced Verisurf 2017, the latest release of the company's measurement software for advanced surface analysis, quality inspection, assembly guidance and reverse engineering.

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Verisurf Software Inc. (Anaheim, CA, US) has introduced Verisurf 2017, the latest release of the company's measurement software for advanced surface analysis, quality inspection, assembly guidance and reverse engineering. The new release includes many enhancements and added capabilities, including:

  • The Verisurf User Interface (UI) has been entirely reorganized with updated icons and enhanced “tool tips” to streamlines workflows, make applications easier to learn and maintain compliance with the latest Windows standards.
  • Programmers can now create custom apps using any common programming language with the rollout of Verisurf Software Development Kit (SDK).
  • Power Surface, the new Verisurf CAD modeling tool, adds the ability to fills holes or fit CAD surfaces through point clouds and meshes with fine tuning control and fidelity previously nonexistent.
  • Improved Scan Data Management with a spectrum of new tools for managing, displaying, editing, and enhancing scan and mesh data. 

SDK apps can run locally, over intranets or the public Internet with Verisurf running minimized or as a background process. Verisurf SDK can streamline sequences of Verisurf tasks and is designed for manufacturing organizations that need to inspect large volumes of the same part or assembly on an ongoing basis. Power Surface includes controls that provide the user with flexibility to develop a variety of surface profiles and boundaries. Power Surface even displays statistical metrics characterizing the quality and fit of surfaces created. Scan Data Management includes new, granular settings for the collection and display of scan data, including Max scan rate, Max scan inspect rate, and Max scan angle. Users can assign color based on the angle between the scanner and the part to assess scan data quality and filter out scan data in areas where point clouds overlap.

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