Dia-Stron (Broomall, PA, US) introduced at CAMX an integrated measurement system for single fibers and filaments. The technology uses a combined laser diffraction and high-resolution extensometer measurement system (LDS/LEX) that reportedly combines measurement integration, precision and automation. It incorporates a high-resolution laser diffraction system with the linear extensometer force measurement unit, permitting the operator to collect dimensional and mechanical data in a single operation. The integrated measurement system is then combined with Dia-Stron’s automated sample loading module, which transports the samples from the loading cassettes to the measurement module. Dia-Stron also produces modules for fiber bending, fatigue and torsion.
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This technology was co-developed by Metis Design Corp. and the Department of Aeronautics and Astronautics at the Massachusetts Institute of Technology.